Modeling of the equivalent circuit of high voltage insulation containing several occlusions (local inhomogeneities)

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Kutsenko S. M., Klimov N. N. Kompleksnoe reshenie problemy razvitiya tekhnicheskogo osnashcheniya in-frastruktury magistral'nogo transporta [Modeling of the equivalent circuit of high voltage insulation containing several occlusions (local inhomogeneities)]. Sovremennye tekhnologii. Sistemnyi analiz. Modelirovanie [Modern Technologies. System Analysis. Modeling], 2020, Vol. 66, No. 2, pp. 37–42. DOI: 10.26731/1813-9108.2020.2(66).37-42

Journal number: 
004.94, 539.3


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There are many methods for assessing the state of high voltage insulation. All of them directly or indirectly register surface partial discharges or partial discharges that form on the surface and / or inside the dielectric. One of the reasons for the destruction of insulation is precisely the large number of such discharge processes. Our simulation of the equivalent circuit for high-voltage insulation allows, most importantly, to conduct a temporary analysis of the transient process that occurs when a pulse voltage is applied to the high-voltage insulation, to see and evaluate the time of the transient process from the beginning of the simulation to the onset of a stable operation mode of the model. The article presents the operation modes of the circuit, which simulate the formation of a partial discharge by the operation of an electronic key or keys, in the case of modeling two occlusions (two partial discharges). The equivalent clearance circuit used in the simulation is based on the classical theory of the formation of partial discharges in high-voltage insulation, but taking into account the features that allow achieving more reliable results that coincide with experimental data. Also, the equivalent circuit model allows you to evaluate the temporal parameters of the discharge by changing the electrical values of the elements of the equivalent circuit. This allows us to conclude that there is an approximate number of partial discharges inside the insulation. Significant differences were noted between the time of the transition process in circuits containing a different number of local inhomogeneities (occlusions). Such an analysis as an assessment of the duration of the transition process can undoubtedly be used as one of the criteria for the state of high-voltage insulation, draw conclusions about its further operation, and plan the timing of replacement of insulation.

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